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Availability and frequency of warm standby systems in the presence of chance with multiple critical errors

Authors
Journal
Microelectronics Reliability
0026-2714
Publisher
Elsevier
Publication Date
Volume
33
Issue
15
Identifiers
DOI: 10.1016/0026-2714(93)90058-7

Abstract

Abstract This paper presents the availability and frequency of encountering different state of k active, N warm standby units in the presence of chance with M multiple critical errors. The system is in a failed state when one of any multiple critical errors has occurred or when (N+1) units have failed. Failed units are not repaired. However, failed system will be repaired with constant repair rates. The expressions for steady-state availability and frequencies of down- and up-states are derived.

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