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Slow-electron-energy-loss spectroscopy in the reflection mode, compared with electron-energy-loss spectroscopy of fast electrons

Authors
Journal
Surface Science
0039-6028
Publisher
Elsevier
Publication Date
Volume
165
Issue
1
Identifiers
DOI: 10.1016/0039-6028(86)90670-9

Abstract

Abstract Some experiments by slow-electron-energy-loss spectroscopy (SEELS) performed in the reflection mode are reported and the results are compared with the published data (when available) obtained by fast-electron-energy-loss spectroscopy in transmission through thin foils. This comparison illustrates similarities and differences between the two techniques with regard to (i) atomic and solid-state analysis and (ii) microanalytical properties. The experimental results concern the following core losses: L 1, L 2,3 in Al and SiC; C 1s in graphite; B 1s and N 1s in hexagonal boron nitride; M 1, M 2,3 in nickel.

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