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Influence of grain boundaries on the electrical resistivity of thin polycrystalline films: A correlation between the Mayadas-Shatzkes and the Wissmann-Wedler equations

Authors
Journal
Thin Solid Films
0040-6090
Publisher
Elsevier
Publication Date
Volume
30
Issue
2
Identifiers
DOI: 10.1016/0040-6090(75)90101-7

Abstract

Abstract The Mayadas-Shatzkes and the Wissmann-Wedler models for the electrical conductivity of thin polycrystalline metal films are discussed. It can be shown that the Wissmann-Wedler equation is an approximation to the Mayadas-Shatzkes equation. This approximation is valid when the film is not too thick and the grain boundary influence on the electrical resistivity is not too strong. A correlation between the parameters of the two models is derived. Conditions for the validity of Matthiessen's rule for the description of the grain boundary influence are given.

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