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Method for the determination of the thermophysical properties of evaporated thin films

Authors
Journal
Thin Solid Films
0040-6090
Publisher
Elsevier
Publication Date
Volume
17
Issue
2
Identifiers
DOI: 10.1016/0040-6090(73)90124-7

Abstract

Abstract A method for detailed investigation of the thermophysical properties of thin films after removal from their substrates is proposed. The thermal conductivity coefficient λ, the coefficient of total emissivity ε and the resistivity ϱ of Al and Ag polycrystalline evaporated films 500–1000 Å thick have been determined in the temperature range 300–900 K.

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