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Neutron diffraction study of Nd0.35La0.65Mn2Si2: A SmMn2Ge2-like magnetic behaviour compound

Authors
Journal
Journal of Magnetism and Magnetic Materials
0304-8853
Publisher
Elsevier
Publication Date
Volume
150
Issue
2
Identifiers
DOI: 10.1016/0304-8853(95)00120-4
Disciplines
  • Physics

Abstract

Abstract Magnetization and neutron diffraction measurements on the ThCr 2Si 2-type structure Nd 0.35La 0.65Mn 2Si 2 compound are reported. This compound is characterized by re-entrant ferromagnetic behaviour, as observed in the SmMn 2Ge 2 compound, with three characteristic magnetic transitions at T C = 295 K, T tl = 220 K (F → AF) and T t2 = 50 K (AF → F). Neutron diffraction study reveals the occurrence of an additional antiferromagnetic region (not detected by magnetometric measurements) characterized by antiferromagnetic (001) Mn planes, between T C = 295 K and T N = 395 K. On the other hand, the occurrence of an in-plane antiferromagnetic Mn component (obviously correlated with a critical MnMn intralayer spacing value of ∼ 2.87 A ̊ ) over the whole ordered range leads us to strongly revise the ferromagnetic ordering previously proposed to take place on the Mn sublattice in such compounds. A new description of the thermal dependence of the Mn sublattice magnetic orderings within the RMn 2X 2 (X = Si, Ge) compounds is proposed.

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