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Direct observation of below-diffraction-limited optical spot induced by nonlinear saturable absorption of Ag-doped Si nanofilms.

Authors
Type
Published Article
Journal
Optics Letters
1539-4794
Publisher
The Optical Society
Publication Date
Volume
35
Issue
18
Pages
3126–3128
Identifiers
DOI: 10.1364/OL.35.003126
PMID: 20847800
Source
Medline
License
Unknown

Abstract

In this work, using the scanning near-field optical fiber probe method, we carry out a direct observation of below-diffraction-limited optical spot induced by nonlinear saturable absorption characteristic of Ag-doped Si nanofilms. The experimental results indicate that the squeezed spot size decreases with laser power increase, and the smallest spot can be squeezed to 68% of the diffraction-limited focusing spot size, which is very useful and can be applied to superresolution optical recording, optical lithography, and optical imaging.

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