This PhD addresses the development of high-power laser diodes emitting at 975nm withhigh efficiency and wavelength stabilized using a Bragg grating. This thesis was conducted in the framework of a close partnership between IMS Laboratory, the GIE III-V lab, who is themain French founder of III-V semiconductor devices for electronic and photonic applications,and THALES Research & Technology in Palaiseau. An in-depth characterization and analysiswork has addressed thermal aspects that contribute, in particular, to limit the optical outputpower of a laser diode. In such a context, we have carried out a set of complementary characterizations both at III-V lab and IMS allowing us to provide some corrective solutionsfor technological optimization concerning the etching depth of the grooves that defines the emitting stripe of the laser diode and the nature of the submount acting as a thermocompensator.These solutions have been proposed from optical modelling implemented with a dedicated simulator, property of III-V lab, and thermal and thermomechanical (multiphysics approach) finite element simulations of the overall microassembled structure. All this work has resulted in the fabrication as well as electro-optical and thermal characterizations of three vertical structures namely LOC (Large Optical Cavity), SLOC (Super Large Optical Cavity)and AOC (Asymmetrical Optical Cavity). The LOC and SLOC vertical structures have been processed with a Fabry-Perot cavity and also including a Bragg grating (DFB architecture) while the AOC one was only fabricated with a Fabry-Perot cavity. State-of-the-art results aredemonstrated since in particular an optical power of 8W with an efficiency of 60% has been obtained that can be compared to those recently published by the Ferdinand-Braun Institute.The originality of the work carried out in this PhD has allowed us to receive a grant from the European Laserlab Cluster (The Integrated Initiative of the European Laser Research Infrastructures), to conduct dedicated experiments at the Max-Born Institute (Berlin) in thegroup of Dr. J.W. Tomm. The work aimed to characterize mechanical strain of the laser diode induced by the soldering process. Two vertical structures (SLOC and AOC) were investigated using complementary techniques (microphotoluminescence, time-resolved photoluminescence,photocurrent spectroscopy and pulsed L-I measurements), allowing to quantify the level of residual stress provided by the laser diode mounting process as well as the kinetics of the catastrophic degradation process (COD).