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Determination of the thickness of polycrystalline thin films by using X-ray methods

Authors
  • Daniš, Stanislav
  • Matěj, Zdeněk
  • Matějová, Lenka
  • Krupka, M.
Publication Date
Jan 01, 2015
Source
[email protected]ŠB-TUO
License
Unknown
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Abstract

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