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ET-AAS Determination of Trace Analytes in High Purity Bismuth and Tellurium Oxides

Authors
Journal
Microchemical Journal
0026-265X
Publisher
Elsevier
Publication Date
Volume
54
Issue
2
Identifiers
DOI: 10.1006/mchj.1996.0087

Abstract

Abstract Optimal conditions for direct electrothermal atomic absorption (ET-AAS) determination of Al, Cd, Co, Cr, Cu, Fe, Mn, Ni, Pb, and V in high purity bismuth oxide and tellurium oxide are described. Matrix interference on the atomization of the analytes is studied. The analytical method developed in this paper permits determination of 0.005 μg g −1Cd and Mn; 0.02–0.05 μg g −1Al, Cu, Cr, and Fe; 0.1 μg g −1Co, Ni, and Pb; 0.5 μg g −1V with relative standard deviation 3–8%.

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