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Temperature dependence of the critical current in bulk sample and thin film of Bi-compound superconductors

Physica C Superconductivity
Publication Date
DOI: 10.1016/0921-4534(91)91350-d


Abstract Temperature dependences of the critical current in Bi(Pb) 2Sr 2CaCu 2O y films prepared on MgO (100) and SrTiO 3 (100) by rf-sputtering, Bi 2Sr 2CaCu 2O y films prepared by MOCVD on MgO (100) and Bi(Pb) 2Sr 2Ca 2Cu 3O y bulk samples were measured in detail. For the bulk sample, the dependence was similar to that in a typical SIS junction. On the other hand, for the case of CVD-grown films without grain boundaries, it is suggestive to be due to SNS junction. The sputtered films with many grains it showed the intermediate behavior between SNS- and SIS-type.

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