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High-resolution transmission electron microscopy study on strained epitaxial manganite thin films and heterostructures

Journal of Magnetism and Magnetic Materials
Publication Date
DOI: 10.1016/s0304-8853(99)00707-6
  • Colossal Magnetoresistance
  • Hrtem
  • X-Ray Diffraction


Abstract Pulsed laser deposition has been used to grow epitaxial La 2/3Sr 1/3MnO 3 and La 2/3Ba 1/3MnO 3 thin films as well as La 2/3Ba 1/3MnO 3/SrTiO 3 heterostructures. The microstructure was studied by four-circle X-ray diffraction and high-resolution transmission electron microscopy. Strain effects due to lattice mismatch between substrate and film, and between different layers in the heterostructures were found to play a key role in determining the thin film properties. La 2/3Ba 1/3MnO 3 films on SrTiO 3 substrates show perfect epitaxy and grow coherently strained over the whole film thickness. In contrast, La 2/3Sr 1/3MnO 3 films on SrTiO 3 substrates were found to form two layers with different lattice parameters separated by an intrinsic interface region containing a high density of defects. La 2/3Ba 1/3MnO 3/SrTiO 3 superlattices are coherently strained and show a very low density of structural defects and sharp interfaces. The observed interface roughness was below 1 nm allowing the controlled growth of continuous two unit-cell thick La 2/3Ba 1/3MnO 3 layers. We also discuss the influence of strain on the electrical transport properties.

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