Affordable Access

deepdyve-link deepdyve-link
Publisher Website

Controlling the Er content of porous silicon using the doping current intensity.

Authors
Type
Published Article
Journal
Nanoscale Research Letters
1556-276X
Publisher
Springer (Biomed Central Ltd.)
Publication Date
Volume
9
Issue
1
Pages
332–332
Identifiers
DOI: 10.1186/1556-276X-9-332
PMID: 25024691
Source
Medline
Keywords
  • Electrochemical Impedance Spectroscopy
  • Er Doping
  • Porous Silicon
  • Reflectivity
  • Scanning Electron Microscopy

Abstract

Statistics

Seen <100 times