Carpenter et al. [Phys. Rev. E 59, 5655 (1999); 61, 532 (2000)] managed to explain ellipsometric critical adsorption data collected from the liquid-vapor interface of four different critical binary liquid mixtures near their demixing critical temperature using a single model. This was the first time a single universal function had been found which could quantitatively describe the surface critical behavior of many different mixtures. There have also been various attempts to investigate this surface critical behavior using neutron and x-ray reflectometries. Results have been mixed and have often been at variance with Carpenter et al. In this paper, the authors show that neutron reflectometry data collected from a crystalline quartz-critical mixture interface, specifically deuterated water plus 3-methylpyridine, can be quantitatively explained using the model of Carpenter et al. derived from ellipsometric data.