Affordable Access

deepdyve-link
Publisher Website

Combined spectroscopic characterization of electron transfer at hybrid CuPcF(16)/GaAs semiconductor interfaces.

Authors
  • Cabanillas-Gonzalez, Juan
  • Egelhaaf, Hans-Joachim
  • Brambilla, Alberto
  • Sessi, Paolo
  • Duò, Lamberto
  • Finazzi, Marco
  • Ciccacci, Franco
  • Lanzani, Guglielmo
Type
Published Article
Journal
Nanotechnology
Publication Date
Oct 22, 2008
Volume
19
Issue
42
Pages
424010–424010
Identifiers
DOI: 10.1088/0957-4484/19/42/424010
PMID: 21832670
Source
Medline
License
Unknown

Abstract

We characterize photoinduced charge injection at the interface between a fluorinated copper phthalocyanine (CuPcF(16)) film deposited over a GaAs(100) wafer by means of pump-probe spectroscopy combined with ultraviolet photoemission spectroscopy (UPS) and electromodulated transmission spectroscopy. UPS characterization of the hybrid interface demonstrates that the CuPcF(16) 's lowest unoccupied molecular level (LUMO) is almost aligned with the GaAs conduction band. Upon photoexcitation of the hybrid interface with 150 fs pulses we observe an efficient photoinduced electron transfer from CuPcF(16) to GaAs. The evolution of interfacial CuPcF(16) charges appear to be strongly influenced by energy level alignment at the GaAs/CuPcF(16) heterojunction.

Report this publication

Statistics

Seen <100 times