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On the characterisation of a Bragg spectrometer with X-rays from an ECR source

Authors
  • Anagnostopoulos, D. F.
  • Biri, S.
  • Gotta, D.
  • Gruber, A.
  • Indelicato, Paul
  • Leoni, B.
  • Fuhrmann, H.
  • Simons, L. M.
  • Stingelin, L.
  • Wasser, A.
  • Zmeskal, J.
Type
Published Article
Publication Date
Dec 23, 2004
Submission Date
Aug 18, 2004
Identifiers
DOI: 10.1016/j.nima.2005.01.311
arXiv ID: physics/0408081
Source
arXiv
License
Unknown
External links

Abstract

Narrow X-ray lines from helium-like argon emitted from a dedicated ECR source have been used to determine the response function of a Bragg crystal spectrometer equipped with large area spherically bent silicon (111) or quartz (10$\bar{1}$) crystals. The measured spectra are compared with simulated ones created by a ray-tracing code based on the expected theoretical crystal's rocking curve and the geometry of the experimental set-up.

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