Affordable Access

Publisher Website

An accurate microdisc simulation model for recessed microdisc electrodes

Authors
Journal
Journal of Electroanalytical Chemistry
1572-6657
Publisher
Elsevier
Publication Date
Volume
453
Identifiers
DOI: 10.1016/s0022-0728(98)00242-3
Keywords
  • Microdisc
  • Chronoamperometric Response
  • Finite Element Method

Abstract

Abstract This study concentrates on an accurate determination of the chronoamperometric response for shallow and deep recessed microdiscs. Diffusion to the recessed microdisc is simulated using the finite element method (FEM). The deviation of the chronoamperometric response for a recessed microelectrode from that for the corresponding inlaid microelectrode can be significant depending on the recess depth. This is noted in terms of the magnitude of the chronoamperometric response and the shape of the chronoamperometric curves. We find cottrellian current decay for deep recess microdiscs at short times “switching” to steady-state behaviour at long times. This switch over in behaviour becomes sharper as the depth of the recess increases. The deviation of the recessed microdisc response from previously proposed approximate expressions is also discussed, with emphasis on the significant deviations for shallow recess microdiscs. The simulation model developed here is accurate yielding transient and steady state values. Approximate analytical expressions which can be used to calculate the transient and steady state responses for recessed microdisc electrodes are presented.

There are no comments yet on this publication. Be the first to share your thoughts.

Statistics

Seen <100 times
0 Comments

More articles like this

Steady-state currents at inlaid and recessed micro...

on Journal of Electroanalytical C... Jan 01, 1999

Application of Danckwerts’ expression to first-ord...

on Journal of Electroanalytical C... Jan 01, 1999

Finite element simulation of electrochemical ac di...

on Journal of Electroanalytical C... Jan 01, 2000
More articles like this..