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Calibration of a JSEM-200 electron microscope.

Authors
  • Blake, RG
  • Jostsons, A
  • Kelly, PM
Publication Date
Oct 01, 1975
Source
ANSTO Publications Online
Keywords
License
Unknown
External links

Abstract

The results of a detailed calibration of a JSEM-200 scanning transmission electron microscope are reported. Two types of measurements have been made: (a) calibration of the various parameters associated with scanning transmission (STEM) imaging, and (b) calibration of the usual parameters required for analytical diffraction contrast experiments in the conventional transmission mode (CTEM). The report also contains a detailed discussion of the various STEM imaging modes and the microscope settings necessary to obtain the required image.

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