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Evanescent-field optical microscopy: effects of polarization, tip shape and radiative waves

Authors
Journal
Ultramicroscopy
0304-3991
Publisher
Elsevier
Publication Date
Identifiers
DOI: 10.1016/0304-3991(92)90301-y

Abstract

Abstract Recent results in evanescent-field optical microscopy are presented. A resolution of 30 nm in the lateral directions and 0.1 nm in height has been obtained by suitable tip fabrication. Both the direction of the exciting field and the tip shape are shown to effect the optical coupling efficiency and resolution. Near-field diffraction patterns are observed with high lateral resolution by interference between evanescent and propagating waves.

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