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Breakdown mechanisms in MgO based magnetic tunnel junctions and correlation with low frequency noise

Authors
  • S. Amara-Dababi
  • R.C. Sousa
  • H. Béa
  • C. Baraduc
  • K. Mackay
  • B. Dieny
Type
Published Article
Journal
Microelectronics Reliability
Publisher
Elsevier
Volume
53
Issue
9-11
Pages
1239–1242
Source
Spintec
Keywords
License
Unknown
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