Binary and rate measures of life event experience: their association with illness onset in Edinburgh and London community surveys.
University Department of Psychiatry, Royal Edinburgh Hospital, U.K.
- Published Article
Journal of Affective Disorders
- Publication Date
Jan 01, 1989
This report examines the extent to which a binary stress index (the experience of at least one severe event) and event rate measures were successful in predicting onset of psychiatric disorder amongst 1029 women. Analyses were based upon samples drawn from Edinburgh and London communities. Whilst the binary measures were successful in discriminating cases from non-cases within each sample, they were less powerful than measures based upon the rate at which events (usually severe) had been experienced. The results are discussed in terms of their relevance to issues of the health consequences of experiencing multiple events, and of the duration over which stressful events may have an influence on psychiatric health.
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This record was last updated on 06/09/2018 and may not reflect the most current and accurate biomedical/scientific data available from NLM.
The corresponding record at NLM can be accessed at https://www.ncbi.nlm.nih.gov/pubmed/2522113