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Behavioural investigation of InN nanodots by surface topographies and phase images

  • Deng, QW
  • Wang, XL
  • Xiao, HL
  • Wang, CM
  • Yin, HB
  • Chen, H
  • Lin, DF
  • Li, JM
  • Wang, ZG
  • Hou, X
Publication Date
Jan 01, 2011
Knowledge Repository of SEMI,CAS
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We employ surface topographies and phase images to investigate InN nanodots. The samples are annealed at 450, 500 and 550 square. The results reveal that the statistical distributions of number density and mean size depend on annealing ambient. The behaviours of thermal annealing between InN films and InN nanodots are distinguishable: the alloying process of InN and GaN not only occurs in InN platelets, but also in InN nanodots once the samples are annealed at the growth temperature of InN nanodots, while the main change in InN films is the decomposition of InN into In droplets and N(2).

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