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Investigation of platinum films grown on sapphire (0 0 0 1) by molecular beam epitaxy

Authors
Journal
Journal of Crystal Growth
0022-0248
Publisher
Elsevier
Publication Date
Volume
234
Identifiers
DOI: 10.1016/s0022-0248(01)01676-1
Keywords
  • A1. Characterization
  • A1. X-Ray Diffraction
  • A3. Molecular Beam Epitaxy
  • B1. Metals

Abstract

Abstract The growth of platinum (Pt) epitaxial films onto sapphire (0 0 0 1) and characterizations by X-ray diffraction and transmission electron microscopy are reported. The results show that high quality Pt films could be obtained in a wide range of substrate temperatures at around 973 K. Electrical resistance experiments on the epitaxial platinum films were carried out at temperatures ranging from 5 to 300 K, which indicates that the Pt/sapphire (0 0 0 1) is an ideal system to investigate the size effect of thin films.

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