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The mechanism of coarsening in the Sn-Cd eutectic during unidirectional solidification

Authors
Journal
Journal of Crystal Growth
0022-0248
Publisher
Elsevier
Publication Date
Volume
22
Issue
1
Identifiers
DOI: 10.1016/0022-0248(74)90055-4

Abstract

Abstract An analysis is made of experimental data on the microstructural coarsening of the lamellar Sn-Cd eutectic behind the growth front during unidirectional solidification. The work indicates that, between 423 K and the melting point, substantial coarsening probably occurs by diffusion in the interphase boundary. This result indicates that melt purity may be important in suppressing eutectic coarsening during growth.

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