Affordable Access

Publisher Website

H NMR in μc-Si:H

Authors
Journal
Journal of Non-Crystalline Solids
0022-3093
Publisher
Elsevier
Publication Date
Identifiers
DOI: 10.1016/0022-3093(83)90285-5

Abstract

Abstract NMR, IR, ESR, Raman scattering and X-ray diffraction measurements were performed in μc-Si:H prepared by various methods. Results of H NMR in some films are qualitatively similar to those i n a-Si:H, but the NMR lines exhibit a motional narrowing. Other films which exhibit sharp IR peaks exhibit H NMR signal shape different from that in a-Si:H.

There are no comments yet on this publication. Be the first to share your thoughts.

Statistics

Seen <100 times
0 Comments

More articles like this

NMR study of μc-Si:H

on Journal of Non-Crystalline Sol... Jan 01, 1983

The influence of H2/Ar ratio on Ge content of the...

on Journal of Alloys and Compound... Jan 01, 2010

An optical study of the correlation between growth...

on Applied Surface Science Jan 01, 2006

Optical, structural and electrical properties of μ...

on Materials Science and Engineer... Jan 01, 2003
More articles like this..