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Determination of superlattice structural parameters by means of far- and mid-infrared reflectivity

Authors
Journal
Solid State Communications
0038-1098
Publisher
Elsevier
Publication Date
Volume
84
Issue
7
Identifiers
DOI: 10.1016/0038-1098(92)90474-n
Disciplines
  • Physics

Abstract

Abstract We investigate infrared reflectivity of GaAs AlAs multiple heterostructures not only in the far- but also in the mid-ir range up to 4000 cm −1. In the transparency region above the “Reststrahlen” bands interference fringes are observed which originate from multiple reflections of radiation inside the SL slab as a whole. A simple analysis of experimental data in the extended ir range, performed in the effective medium approximation, allows a very accurate determination not only of the total SL thickness but also of the individual layer thicknesses.

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