Affordable Access

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Wiley - V C H Verlag GmbH & Co. KGaA
Publication Date
  • Mathematics


Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH & Co. KGaA.

There are no comments yet on this publication. Be the first to share your thoughts.