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Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Authors
Publisher
Wiley - V C H Verlag GmbH & Co. KGaA
Publication Date
Disciplines
  • Mathematics

Abstract

Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH & Co. KGaA.

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