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A review of new methods and attitudes in reliability engineering

Authors
Journal
Microelectronics Reliability
0026-2714
Publisher
Elsevier
Publication Date
Volume
12
Issue
4
Identifiers
DOI: 10.1016/0026-2714(73)90326-0
Disciplines
  • Engineering

Abstract

Abstract The paper reviews new attitudes and methods in reliability engineering, showing inter alia, the growing scepticism about, and sophistication of, reliability prediction. The emphasis on reliability physics and reliability improvement programs is discussed, as well as recent work on accelerated testing, component screening and reliability testing of integrated circuits by means of a standard component. Recently investigated failure mechanisms and tools of analysis are reviewed. The U.K. BS9000 scheme and its status are briefly discussed.

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