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Low frequency voltage noise in high temperature superconductor Josephson junctions

Authors
Journal
Applied Superconductivity
0964-1807
Publisher
Elsevier
Publication Date
Volume
6
Identifiers
DOI: 10.1016/s0964-1807(99)00020-4
Disciplines
  • Physics

Abstract

Abstract The origin of 1/ f voltage noise in different types of Josephson junctions fabricated from the high temperature superconductors (HTS) have been traced back to the trapping and release of charge carriers in trapping centers in an insulating barrier giving rise to correlated fluctuations of the junction critical current I c and normal state resistance R n. For the normalized fluctuations S I and S R a linear scaling with R n has been observed which suggests an almost constant density of trapping centers for all investigated HTS Josephson junctions. Using this linear scaling we have made an approximate calculation of the density of the trapping centers.

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