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High-resolution electron microscopy in structural studies of inorganic materials

Authors
Journal
Solid State Ionics
0167-2738
Publisher
Elsevier
Publication Date
Volume
8
Issue
3
Identifiers
DOI: 10.1016/0167-2738(83)90016-4

Abstract

Abstract A summary is given of the use of high-resolution electron microscopic imaging methods in structure determination, stressing their advantage over conventional diffraction methods, and the instrumental and specimen-dependent limitations on their applicability. Some examples of the use of this technique are given, both in systems where the unit-cell structure is known and only long-range order is lacking, and in cases of completely unknown phases.

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