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Microcrystallography using electron channeling; structure factor phase information and crystal site determination

Authors
Journal
Ultramicroscopy
0304-3991
Publisher
Elsevier
Publication Date
Volume
26
Identifiers
DOI: 10.1016/0304-3991(88)90382-8

Abstract

Abstract Electron channeling effects in secondary radiation, in particular X-ray emission and energy loss spectroscopy, can be used to determine sites of solute atoms or to distinguish between atoms of nearly equal scattering power. This information about position can alternatively be presented as structure factor phase information in reciprocal space. Two-beam cases are used to demonstrate this, by three examples: determination of polarity in a GaAs crystal from asymmetry in the spectroscopy signal with beam tilt across the (111) planes: determination of ionicities of Ti and Fe in ilmenite from phase relationships, and location of a solute atom in an olivine at a concentration level of 0.01%.

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