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Measurement of electrooptic constant with the reflection intensity method

Authors
Journal
Optics Communications
0030-4018
Publisher
Elsevier
Publication Date
Volume
101
Identifiers
DOI: 10.1016/0030-4018(93)90727-m

Abstract

Abstract A new method to measure electrooptic constants is introduced. The advantages and the weak points of this method are discussed. The new method has been compared with the other methods. The electrooptic constant r 333 of K 0.7Rb 0.3TP crystal has been measured with this method.

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