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Orientation relations between thin evaporated copper films and copper(I) oxide

Authors
Journal
Micron (1969)
0047-7206
Publisher
Elsevier
Publication Date
Volume
14
Issue
1
Identifiers
DOI: 10.1016/0047-7206(83)90031-6
Keywords
  • Thin Copper Films
  • Copper(I) Oxide
  • Oxidation Of Thin Copper Films
  • Orientation Relations

Abstract

Abstract The oxidation of thin evaporated copper films on alkali halide substrates yields highly oriented copper(I) oxide. Selected area electron diffraction shows the existence of four different sets of orientation relations between copper and its oxide, partly unobserved in previous studies. This illustrates the danger of transferring data obtained from other material to thin films prepared in a specific way without taking into account the morphology of the latter.

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