Abstract Several relations are given that allow the direct mapping of electrostatic properties from X-ray structure factors. The properties include the electrostatic potential, electric force fields, electric field-gradients, the electron density, gradient of the electric field-gradient and gradient of the electron density. In applications, mapping of these properties from the deformation electron density is preferable. Three maps for oriented N 2 are shown as examples. Each inner moment property has a different dependence on sin Θ/λ. The electrostatic potential is most easily resolved while the gradient of the electric field-gradient and of the charged density are the most difficult to resolve.