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Complementary observations of defects in quasicrystals by X-ray topography and electron microscopy

Authors
Journal
Physica B Condensed Matter
0921-4526
Publisher
Elsevier
Publication Date
Volume
253
Identifiers
DOI: 10.1016/s0921-4526(98)00366-4
Keywords
  • Quasicrystals
  • Defects
  • X-Ray Topography
  • Electron Microscopy
Disciplines
  • Chemistry

Abstract

Abstract Further information on defects previously [J. Gastaldi et al. Phil. Mag. Lett. 72 (1995) 311.] observed by X-ray topography in quasicrystalline grains, and that show a loop-shaped contrast, was obtained by combining this technique with electron microscopic observations and chemical analyses. The experiments, carried out either at room temperature or during in situ and real-time high temperature annealing, allowed to get clues on the relationships between these loop-shaped defects, the growth process of the quasicrystal grains and the defect behaviour under the annealing treatment.

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