Affordable Access

Publisher Website

Study on the interface of ferrite / Sendust film

Authors
Journal
Journal of Magnetism and Magnetic Materials
0304-8853
Publisher
Elsevier
Publication Date
Volume
133
Identifiers
DOI: 10.1016/0304-8853(94)90609-2

Abstract

Abstract Auger electron spectroscopy (AES) and cross sectional transmission electron microscopy (XTEM) have been applied to study the diffusion barriers at the interface between the Sendust based film and the ferrite core in the MIG heads. A transition zone containing Al 2O 3 was observed by XTEM at the interface of ferrite / Sendust after annealing at 550°C for 1 h. W and Mo films were found to be effective diffusion barriers, whereas Cr and Au films were found to be rather ineffective. The reduction of ripple less than 1.5 dB in the head with W barrier layer was attributed to the decrease of the pseudo-gap length due to the diffusion barrier effect. This playback performance correlates well with the AES and XTEM results.

There are no comments yet on this publication. Be the first to share your thoughts.

Statistics

Seen <100 times
0 Comments

More articles like this

Characteristics of hetero-interfaces between MnAs...

on Journal of Crystal Growth Jan 01, 2002

Characterization of sputtered Sendust films by the...

on Nuclear Instruments and Method... Jan 01, 1993

Mössbauer study of the structure of rapidly quench...

on Journal of Magnetism and Magne... Jan 01, 1986
More articles like this..