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Confocal photo-stimulated microspectroscopy (CPSM)—residual stress measurements in Al2O3using confocal microscopy

Authors
Journal
Scripta Materialia
1359-6462
Publisher
Elsevier
Publication Date
Volume
53
Issue
3
Identifiers
DOI: 10.1016/j.scriptamat.2005.04.016
Keywords
  • Thermally Grown Oxide (Tgo)
  • Residual Stresses
  • Microstructure
  • Optical Spectroscopy

Abstract

Abstract A new technique, confocal photo-stimulated microspectroscopy (CPSM), was used to measure the residual stress of the thermally grown oxide (TGO) on several Al 2O 3-scale forming Ni-based alloys. CPSM provides improved resolution over previous techniques, and has revealed residual stress variations as large as 3 GPa over 1.5 μm.

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