Affordable Access

Publisher Website

Theoretical simulation of noncontact AFM images of Si(111) √3×√3-Ag surface based on Fourier expansion method

Authors
Journal
Applied Surface Science
0169-4332
Publisher
Elsevier
Publication Date
Volume
157
Issue
4
Identifiers
DOI: 10.1016/s0169-4332(99)00552-8
Keywords
  • Noncontact Atomic-Force Microscopy
  • Dft
  • Lda
  • Si(111) √3×√3-Ag Surface
  • Hct Model
  • Tip–Surface Interaction Force
  • Frequency Shift
  • Image

Abstract

Abstract A Fourier expansion method is introduced to simulate the noncontact atomic force microscopy (NC-AFM) images in an efficient way, where three dimensional (3D) tip–surface interaction force distribution calculated by the first-principles density functional (LDA) calculations are fitted to an analytical function. As an example of application of this method, we adopt a Si(111) √3×√3 R30°-Ag surface. Force spectroscopies and 2D images for different tip height are presented.

There are no comments yet on this publication. Be the first to share your thoughts.