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Syntactic pattern recognition for the recognition of bright spots

Authors
Journal
Pattern Recognition
0031-3203
Publisher
Elsevier
Publication Date
Volume
18
Issue
6
Identifiers
DOI: 10.1016/0031-3203(85)90012-3
Keywords
  • Error Probability
  • Bright Spots
  • Levenshtein Distance
  • Candidate Bright Spots
  • String Distance
  • Amplitude-Dependent Encoding

Abstract

Abstract Syntactic pattern recognition techniques are applied to the analysis of one-dimensional seismic traces and two-dimensional seismograms for the detection of bright spots. The calculation between error probability and Levenshtein distance is proposed. The system for two-dimensional seismic analysis includes three kinds of string distance computation to test the continuity of a bright spot pattern.

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