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On the cyclotron resonance width of very pure Ge

Authors
Journal
Solid State Communications
0038-1098
Publisher
Elsevier
Publication Date
Volume
37
Issue
11
Identifiers
DOI: 10.1016/0038-1098(81)90510-x

Abstract

Abstract The temperature variation of the cyclotron resonance width Γ for a very pure semiconductor is calculated numerically based on the earlier theory [S. Fujita & A. Lodder, Physica 83B, 117 (1976)]. The results are in excellent agreement with experiments by Kawamura et al. for very pure Ge.

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