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McXtrace: A modern ray-tracing package for X-ray instrumentation

Authors
Publisher
S P I E - International Society for Optical Engineering
Publication Date
Keywords
  • Optics
  • Materials Characterization And Modelling
  • Physics
  • Engineering
  • X-Ray Simulations
  • Ray Tracing
  • Mcxtrace
  • Monte Carlo
  • Materialekarakterisering Og Modellering

Abstract

we present the developments of the McXtrace project, a free, open source software package based on Monte Carlo ray tracing for simulations and optimisation of complete X-ray instruments. The methodology of building a simulation is presented through an example beamline, namely Beamline 811 at MAX-lab, Lund, Sweden - a beamline dedicated to materials science. © 2011 COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

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