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Evaluation of mixed-signal noise effects in photon-counting X-ray image sensor readout circuits

Authors
Journal
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
0168-9002
Publisher
Elsevier
Publication Date
Volume
563
Issue
1
Identifiers
DOI: 10.1016/j.nima.2006.01.098
Keywords
  • Noise Coupling
  • Photon Counting
  • Methodology
  • Simulation
  • Mixed-Signal
Disciplines
  • Design
  • Physics

Abstract

Abstract In readout electronics for photon-counting pixel detectors, the tight integration between analog and digital blocks causes the readout electronics to be sensitive to on-chip noise coupling. This noise coupling can result in faulty luminance values in grayscale X-ray images, or as color distortions in a color X-ray imaging system. An exploration of simulating noise coupling in readout circuits is presented which enables the discovery of sensitive blocks at as early a stage as possible, in order to avoid costly design iterations. The photon-counting readout system has been simulated for noise coupling in order to highlight the existing problems of noise coupling in X-ray imaging systems. The simulation results suggest that on-chip noise coupling should be considered and simulated in future readout electronics systems for X-ray detectors.

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