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Quantitative measurement of tip–sample forces by dynamic force spectroscopy in ambient conditions

Authors
Journal
Surface Science
0039-6028
Publisher
Elsevier
Publication Date
Volume
579
Issue
1
Identifiers
DOI: 10.1016/j.susc.2005.01.026
Keywords
  • Atomic Force Microscopy
  • Adhesion

Abstract

Abstract We introduce a dynamic force spectroscopy technique enabling the quantitative measurement of conservative and dissipative tip–sample forces in ambient conditions. In difference to the commonly detected force-vs-distance curves dynamic force microscopy allows to measure the full range of tip–sample forces without hysteresis effects caused by a jump-to-contact. The approach is based on the specific behavior of a self-driven cantilever (frequency-modulation technique). Experimental applications on different samples (Fischer-sample, silicon wafer) are presented.

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