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Critical composition dependence of the hydrogenation of Mg2± δNi thin films

Authors
Journal
Journal of Alloys and Compounds
0925-8388
Publisher
Elsevier
Publication Date
Volume
428
Identifiers
DOI: 10.1016/j.jallcom.2006.03.061
Keywords
  • Light Absorption And Reflection
  • Hydrogen Storage Materials
  • Thin Films

Abstract

Abstract The hydrogenation of metallic Mg 2 Ni films was shown to proceed via a self-organized double layering of transparent Mg 2 NiH 4 and metallic Mg 2 NiH 0.3. For stoichiometries departing from Mg 2 Ni we conclude from optical reflection, transmission and electrical measurements that the hydrogenation process involves two competing effects: (i) the nucleation of the initial Mg 2 NiH 4 layer near the substrate and the ensuing growth of this layer and (ii) the slow random nucleation of the same phase within the remaining part of the film. Which process dominates depends critically on the stoichiometry of the parent metal alloy.

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