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Dipoles, defects and interfaces

Authors
Journal
Surface Science
0039-6028
Publisher
Elsevier
Publication Date
Volume
132
Identifiers
DOI: 10.1016/0039-6028(83)90552-6

Abstract

Abstract The importance of dipole layers at interfaces is emphasized. The differences between the dipole layers in the case of submonolayer coverages and those that are important in the case of metal-semiconductor and semiconductor-semiconductor interfaces are explored.

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