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Depth resolved ion beam analysis of objects of art

Authors
Journal
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
0168-583X
Publisher
Elsevier
Publication Date
Volume
118
Identifiers
DOI: 10.1016/0168-583x(95)01193-5
Keywords
  • Section V. Particle-Induced X-Ray Emission

Abstract

Abstract The external proton beam progressively gains more attention, particularly in connection with recent new possibilities combining non-vacuum PIXE and RBS. To identify paint layer arrangements and their elemental composition external PIXE was applied varying the incident proton energy. This technique is checked on a set of test paint layers combining pigments typically applied in the Middle Ages as well as presently. Thin surface paint has been successfully characterized by means of simultaneous external RBS complementary to PIXE. Presented as an example are depth resolved measurements on a red colored detail of the painting “14 Nothelfer” from Lucas Cranach the Elder.

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