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X-ray diffraction studies of epitaxial Pb(Zr,Ti)O3films prepared by chemical solution method

Authors
Journal
Materials Chemistry and Physics
0254-0584
Publisher
Elsevier
Publication Date
Volume
57
Issue
3
Identifiers
DOI: 10.1016/s0254-0584(98)00223-5
Keywords
  • Pb(Zr
  • Ti)O3
  • Reciprocal-Space Map
  • Tetragonal Phase

Abstract

Abstract In this study, epitaxial Pb(Zr,Ti)O 3 thin films prepared on various substrates by dipping-pyrolysis process were investigated using asymmetric X-ray diffraction 2 θ/ ω scans. Epitaxially grown films heat-treated at 750°C on Nb-doped SrTiO 3(100) and LaAlO 3(100) were found by reciprocal-space map analysis to consist of the c-axis-oriented tetragonal phase.

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