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Analysis of non-catastrophic failures in electronic devices due to random noise

Authors
Journal
Microelectronics Reliability
0026-2714
Publisher
Elsevier
Publication Date
Volume
16
Issue
5
Identifiers
DOI: 10.1016/0026-2714(77)90290-6

Abstract

Abstract In the present paper, a model to evaluate the expected number of non-catastrophic failures in an electronic device, due to noise, has been developed under the assumption that the first time derivative of the amplitude of signal plus noise follows non-Gaussian distribution. The number of failures so obtained enables one to find out the Reliability of the system. For a particular case results seem to correspond to those obtained by Bendat [1].

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