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Radiation tolerance of Cu/W multilayered nanocomposites

Authors
Journal
Journal of Nuclear Materials
0022-3115
Publisher
Elsevier
Publication Date
Volume
413
Issue
1
Identifiers
DOI: 10.1016/j.jnucmat.2011.03.030

Abstract

Abstract Magnetron sputtered Cu/W multilayer samples with individual layer thicknesses from 2.5 to 50 nm were irradiated by 50 keV He + ions at ion fluences from 7 × 10 20 to 6 × 10 21 m −2 at room temperature. Evolution of the interfacial structure during irradiation is monitored by X-ray diffraction and cross-sectional transmission electron microscopy. Moreover, radiation responses on the individual layer thickness and He + ion irradiation fluence are revealed. The highly morphological stability of the multilayered structure suggests that the interfacial structure and grain boundary can serve as sinks for radiation-induced defects.

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