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CN-induced surface layer expansion of Ni(110): a MEIS study

Publisher
ELSEVIER SCIENCE BV
Publication Date
Keywords
  • Qd Chemistry
  • Qc Physics

Abstract

Medium energy ion scattering (MEIS) using 100 keV H+ incident ions has been used to determine the outermost substrate layer spacings of clean Ni(110) and Ni(110)c(2 x 2)-CN. Experimental blocking curves were obtained using [(1) over bar 00], [(112) over bar] and [(1) over bar 01] ion incident directions and these have been interpreted with the aid of theoretical simulations for different model structures. For the Ni(110)c(2 x 2)-CN surface phase the ion scattering data indicate a substrate outermost layer expansion of 21.2 +/- 1.6%, providing independent confirmation of the large CN-induced surface layer relaxation obtained in an earlier scanned-energy mode photoelectron diffraction study of this surface. (C) 2001 Elsevier Science B.V. All rights reserved.

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