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Investigation of a metal-ionic conductor interface in thin film samples using X-ray photoelectron spectroscopy and electrical measurements

Authors
Journal
Thin Solid Films
0040-6090
Publisher
Elsevier
Publication Date
Volume
89
Issue
4
Identifiers
DOI: 10.1016/0040-6090(82)90318-2

Abstract

Abstract The surface of an evaporated thin film of the ionic conductor β-PbF 2 was analysed using X-ray photoelectron spectroscopy (XPS). The results were compared with those obtained from nuclear and secondary ion mass spectrometry measurements. An analysis of the Au-β-PbF 2 interface shows the presence of a thin layer of partly oxidized metallic lead. Part of this interfacial lead diffused across the gold film towards the external surface where it became bound to oxygen. An electrical analysis of the interface was performed by studying the capacitance as a function of the surface potential. The differences between experimental and calculated values are discussed in the light of the XPS measurements.

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